Analysis of Adhesive Penetration into Wood using Nano-X-ray Computed Tomography

Authors

  • Paige McKinley Oregon State University
  • Frederick A. Kamke Oregon State University
  • Arijit Sinha Oregon State University
  • Vincent De Andrade Advanced Photon Source, Argonne National Laboratory
  • Joseph E. Jakes Forest Products Laboratory

Keywords:

nano-X-ray computed tomography, X-ray fluorescence microscopy, energy dispersive X-ray spectroscopy, adhesive, cell wall penetration

Abstract

This study focused on the penetration of adhesive into cell lumens and cell walls. Douglas-fir samples containing an iodinated phenol-formaldehyde adhesive were analyzed using nano-X-ray computed tomography (XCT), X-ray fluorescence microscopy, and energy-dispersive X-ray spectroscopy to observe adhesive penetration in cell walls. A gradient of penetration was observed within the cell wall structure. In addition, these nano-XCT datasets were indexed to previous micro-XCT datasets, which gave the ability to link the nanoscale cell wall penetration to microscale penetration in to the porous network of cell lumens.

 

Author Biographies

Paige McKinley, Oregon State University

Masters Candidate, Department of Wood Science and Engineering, College of Forestry, Oregon State University

Frederick A. Kamke, Oregon State University

Professor

Department of Wood Science & Engineering

Oregon State University

Arijit Sinha, Oregon State University

Assistant Professor

Department of Wood Science & Engineering

Oregon State University

Vincent De Andrade, Advanced Photon Source, Argonne National Laboratory

Beamline Scientist, X-ray Division

Advanced Photon Source, Argonne National Laboratory

Joseph E. Jakes, Forest Products Laboratory

Research Materials Engineer

Forest Biopolymers Science and Engineering

USDA Forest Service, Forest Products Laboratory

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Published

2018-01-30

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